NI has set out its stall for AI in the test industry. Following the announcement of LabView AI assistant at the end of last year (currently in beta testing), CTO of technology and innovation, Kevin Shultz spoke to Electronics Weekly about what will be the role of AI in test. He explained that the increasing complexity of products being tested ...
For coastal and mountainous terrain, Anritsu has added an up-link interference measurement to its some of its portable 5G and LTE TDD testers. At issue are stray signals carried long distances into cells where they interfere with the TDD up-link. The company explained: For 5G networks with a coastal or mountainous terrain, RF down-link transmissions readily become subject to atmospheric ...
A novel approach from Siemens and PDF Solutions improves yield ramp on advanced nodes and solves yield limiters through volume manufacturing. Improving yield is key to reducing manufacturing cost and maximizing profits in a highly competitive semiconductor market. While large yield limiters are addressed early in the process during yield ramp, subtle systematic layout patterns continue to cause physical defects ...
Smiths Interconnect has created an IC test socket for high-speed testing of 350μm minimum pitch devices. Called DaVinci Micro, the test socket has shielded connections to isolate signal paths, with -35dB crosstalk claimed at 40GHz, as well as -10dB return loss at the same frequency and -1dB insertion loss at 31GHz. There are to impedance variants: 851-0023043-HG01 for 50Ω and ...
At PCIM this week in Nuremberg, PEM has exhibiting a Rogowski current probe optimised for SiC transistors and other fast switching devices, with a -3dB bandwidth of 50MHz and a 12.5ns rise-time. Called CWTMini50HF, it has a slim (3.5mm thick) 100mm sense coil with 2kVpeak insultation. “It combines a screened Rogowski coil, providing excellent immunity to interference from fast local dV/dt ...
Advantest is aiming at software-based functional testing and USB/PCIe scan testing of ICs with USB and PCIe ‘Link Scale’ digital channel cards for its V93000 Smart Scale or V93000 EXA Scale Systems. USB version “Many of today’s complex SoCs, microprocessors, graphics processors and AI accelerators incorporate high-speed digital interfaces such as USB or PCIe.,” according to the company. “The Link Scale ...
Siglent Technologies has announced 360, 720 and 1,080W ac-dc power supplies that can deliver up to 90A or 160V, or be connected together to deliver up to 3,240W – two series for 0 – 320V and three parallel for 0 – 270A. Called the SPS5000X series, there are 10 different single output versions, three dual output and three triple output – ...
The future of automotive testing is to be the subject of webinars produced by Rohde & Schwarz, the University of Warwick and the Midlands Future Mobility. “The automotive industry has clear targets and ambitions for ‘vision zero’, self-driving and electrified line-ups to ensure a safer and connected driving experience,” said Rohde & Schwarz business development manager Rob Short. “To achieve those ...
42 Technology of Cambridgeshire has developed an automated inspection technology that can detect scratches wider than 10μm on polished glass surfaces in under a second. Developed with Swiss company Inficon, it will be used by Inficon to partly automate quality control – finding scratches before silicon sensors are bonded to glass in the manufacture of helium leak detectiors. It is a ...
Anritsu and Tektronix are offering an automated PCI Express 5.0 (PCIe Gen5) tester, combining Anritsu’s RMP1900A bit error rate tester (BERT) with Tektronix’ DPO70000SX 70GHz real-time oscilloscope, and automation software. “The all-in-one solution supports tests of PCIe 5.0 electrical characteristics and physical-layer protocol analysis, and supports automated transmitter test, receiver jitter tolerance test and Tx/Rx link equalisation training [LEQ] compliance test ...
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