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Tag Archives: NI

NI’s vision for hybrid AI

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NI has set out its stall for AI in the test industry. Following the announcement of LabView AI assistant at the end of last year (currently in beta testing), CTO of technology and innovation, Kevin Shultz spoke to Electronics Weekly about what will be the role of AI in test. He explained that the increasing complexity of products being tested ...

National instruments launches ADAS data gathering fleet

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National Instruments has announced a fleet of vehicles for Europe, the US and China that will record data for autonomous driving research. The intention is to provide data for training, testing and validating perception algorithms and hardware. “ADAS data recording is one of the most complex challenges, as data from multiple sensor modalities – camera, radar, lidar, ultrasonics, infrared, IMUs, ...

Transceivers aim at 25-33GHz and 37-43GHz for 5G NR research

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National Instruments is aiming at 5G NR research and prototyping with two series of millimeter wave (mmWave) radio heads that stretch coverage of its existing mmWave Transceiver System, across 24.5-33.4GHz and 37.0-43.5GHz. “As the first phase of 5G NR wraps up and the 3GPP finishes defining the communications protocol, the standards body also has identified specific frequency bands intended for 5G,” ...

NI brings TSN to CompactRIO

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NI’s latest CompactRIO Controllers include NI-DAQmx and Time Sensitive Networking (TSN) to support deterministic communication and synchronised measurements across standard Ethernet networks. TSN has evolved from the IEEE 802.11 Ethernet standard, and it can be used to synchronise distributed systems across networks, which eliminates the need for additional synchronisation cables. A design challenge for industrial Internet of Things (IIoT) applications ...

NI increases channel density in semiconductor test push

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NI has introduced a PXI-based source measure unit (SMU), which provides six times more DC channel density than its previous PXI SMUs for testing RF, MEMS, and mixed-signal and other analogue semiconductor components. According to Eric Starkloff, NI executive vice president of global sales and marketing, semiconductor test is “a strategic focus” and the company is extending the capabilities of ...

PTP’s LabVIEW Architect to speak at NI Days

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A specialist in LabVIEW at Cambridgeshire-based Product Technology Partners will be  presenting at this year’s NI Days national conference at Sandown Park Racecourse, Esher, on Tuesday 28th November. David Barr, a Senior Systems Engineer at PTP, is one of a few LabVIEW Architects in the country and he will be offering a chance to discuss projects and problems in the ...

NI adds time sensitive networking to CompactDAQ platform

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NI’s latest CompactDAQ chassis incorporates time-based synchronisation built on the latest Ethernet standards. This brings together time sensitive networking (TSN) with CompactDAQ hardware for distributed measurements. As industrial measurement systems move closer to the device under test it is creating challenges with synchronisation and systems management. TSN as the next evolution of the IEEE 802.1 Ethernet standard is designed to ...

NI uses power of Atom processor for vision system

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Gigabit Ethernet or USB 3.0 camerasNI has designed a quad-core Intel Atom processor into a vision system. The module has reconfigurable I/O supporting Gigabit Ethernet or USB 3.0 interfaces for connecting high speed cameras Designated the CVS-1459RT, it is based on the LabVIEW reconfigurable I/O (RIO) architecture. The vision system has 24 reconfigurable digital I/O lines, these are: eight 5-24Vdc isolated input lines, eight 5-24Vdc isolated output ...